The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Sep. 25, 2003
Applicants:
Fumio Isshiki, Kokubunji, JP;
Masakazu Sugaya, Kawasaki, JP;
Tatsundo Suzuki, Musashimurayama, JP;
Masahiro Yamaoka, Hachioji, JP;
Sumio Hosaka, Hinode, JP;
Inventors:
Fumio Isshiki, Kokubunji, JP;
Masakazu Sugaya, Kawasaki, JP;
Tatsundo Suzuki, Musashimurayama, JP;
Masahiro Yamaoka, Hachioji, JP;
Sumio Hosaka, Hinode, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 902 ;
U.S. Cl.
CPC ...
Abstract
An absolute accuracy in the range from ±2 nm to ±1 nm for a displacement measurement value is provided by a laser interferometer displacement measuring system. A fluctuating error component that appears corresponding to the wave cycle of laser light is detected and subtracted from the measurement value while a stage is moving, thereby providing a high accuracy.