The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2005

Filed:

Mar. 15, 2002
Applicants:

Xiansong Chen, Charlotte, NC (US);

Yinbao Yang, Charlotte, NC (US);

Inventors:

Xiansong Chen, Charlotte, NC (US);

Yinbao Yang, Charlotte, NC (US);

Assignee:

Digital Optics Corp., Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2125 ; H01S 313 ;
U.S. Cl.
CPC ...
Abstract

A wavelength monitor includes: a splitter on an optics block dividing an input beam into a first portion and a second portion; a first detector and a second detector; a wavelength selective element in an optical path of one of the first and second portions before a respective detector; and an optical bench on which the splitter, the first and second detectors, and the wavelength selective element are mounted. The optical bench may include a hole through which an application beam, separate from the first and second portions, is to pass. The optical bench may include a reflective surface below an active area of the detectors for directing the light onto the active areas.


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