The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Mar. 19, 2002
Applicant:
Marc Kouwenhoven, Eindhoven, NL;
Inventor:
Marc Kouwenhoven, Eindhoven, NL;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 300 ;
U.S. Cl.
CPC ...
Abstract
At least one reference plane, but preferably three orthogonal reference planes (A, C, S) are defined in a magnetic resonance imaging method. A cut plane is chosen so as to extend at an angle to one (single oblique) (SO) or two (double oblique) (DO) of the reference planes. One side of the field of view within the cut plane remains parallel to one (of the) reference plane (planes). A cross-sectional magnetic resonance image along the cut plane is reconstructed from magnetic resonance signals.
Kouwenhoven, Marc. (2005). Magnetic resonance imaging method for an angulated cut plane with respect to a reference frame (U.S. Patent No. 6838879). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6838879
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile