The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Nov. 12, 2002
Oscar O. Lewis, Humble, TX (US);
Thomas C. Schreiner, Muelheim, DE;
Miguel A. Felix, Irwin, PA (US);
Oscar O. Lewis, Humble, TX (US);
Thomas C. Schreiner, Muelheim, DE;
Miguel A. Felix, Irwin, PA (US);
Siemens Westinghouse Power Corporation, Orlando, FL (US);
Abstract
A method and system () for enhancing the determination of the presence of a surface breaking or subsurface defect with an object () under test are provided (FIG.). The method can include transferring ultrasonic energy to an object () under test and sensing images (') of the object () under test before and after transferring ultrasonic energy to the object () with an infrared thermography camera (). An increase in temperature gradients in the areas adjacent a defect (′) is shown in the images (′) produced by the camera (), which indicates the presence of the defect (′). The temperature gradients in the area of the defect (′) and images of the defect (′) can be displayed to enable users to determine the temperature gradient and thus the extent of the defect (′). Digital images (′) of the before and after transferring ultrasonic energy can be superimposed (″) to identify and illustrate the defect (″).