The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2005

Filed:

Nov. 20, 1998
Applicants:

Yoseph Koltunov, Holon, IL;

Alexander Maximov, Jerusalem, IL;

Igor Meltin, Giv'at Shmuel, IL;

Motti Allon, Mazkeret Batya, IL;

Glen Guttman, Tel Aviv, IL;

Arik Kershenbaum, Ra'Anana, IL;

Inventors:

Yoseph Koltunov, Holon, IL;

Alexander Maximov, Jerusalem, IL;

Igor Meltin, Giv'at Shmuel, IL;

Motti Allon, Mazkeret Batya, IL;

Glen Guttman, Tel Aviv, IL;

Arik Kershenbaum, Ra'Anana, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 502 ; G01J 100 ; G06K 946 ;
U.S. Cl.
CPC ...
Abstract

A method and a system for determining temperature and/or emissivity of an object by remote sensing are described. Based on the concept of temperature and emissivity determination, there are also developed a method and a system for the detection and recognition of an object that includes a plurality of sub-objects. The method for the detection and recognition of an object comprises acquiring, inter alia, electromagnetic radiation data of electromagnetic radiation emitted from a selected region in at least two spectral bands, recording and storing the required electromagnetic radiation data, deriving descriptive maps constituted by pixels of the selected region from the stored data and classifying the pixels of said descriptive maps of said selected region by pattern recognition processor means.


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