The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Mar. 25, 2003
Robert J. Ferran, San Diego, CA (US);
Daniel M. Rohrbach, San Diego, CA (US);
Michael Oswald, San Diego, CA (US);
Robert J. Ferran, San Diego, CA (US);
Daniel M. Rohrbach, San Diego, CA (US);
Michael Oswald, San Diego, CA (US);
Stec Inc., , JP;
Abstract
A capacitance diaphragm gauge (CDG) for measuring pressure includes a flush diaphragm mounted to a body structure via a shim or other raised perimeter portion. The diaphragm and the shim are welded to the body structure while the diaphragm is maintained at an elevated temperature. Contraction of the diaphragm as it cools pretensions the diaphragm to substantially reduce hysteresis effects. An electrode advantageously includes two portions with one portion providing excellent bonding characteristics and the other portion having temperature characteristics corresponding to the body structure and the diaphragm. An alternative CDG includes two identical electrodes with a first electrode positioned proximate to the center of the diaphragm and with a second electrode positioned proximate to the perimeter of the diaphragm. The second electrode provides a second capacitance signal that is used to compensate for changes in capacitance between the diaphragm and the first electrode caused by temperature changes.