The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2004

Filed:

Jan. 31, 2003
Applicant:
Inventors:

Thomas Köhler, Hartenstein, DE;

Bernhard Zintzen, Heidelberg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 1/738 ;
U.S. Cl.
CPC ...
G01C 1/738 ;
Abstract

A method of determining a relative position of first and second imaging devices includes setting an image of a group of mutually different reference patterns and a basic pattern on an imaging medium, with the second imaging device. Each reference pattern of the group is assigned uniquely to one relative position. An image of at least one test pattern is set over the basic pattern by the first imaging device, for forming a combination pattern. A reference pattern having an area coverage coinciding with an area coverage of the combination pattern is identified from the group of reference patterns. A relative position associated with the identified reference pattern of the group of reference patterns is then identified. A printing form exposer, a printing unit, a printing unit group and a printing press for performing the method are also provided.


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