The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2004
Filed:
Sep. 08, 2003
Gary L. Burkhardt, Adkins, TX (US);
Jay L. Fisher, San Antonio, TX (US);
Ronald H. Peterson, Helotes, TX (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
The invention provides an electronic circuit means for injecting virtual flaw signals into the signal path between a NDT test instrument and an associated probe. This enables a system that is capable of generating virtual flaw signals to present virtual flaws to an NDT inspector while enabling the test probe to present actual flaws to the NDT inspector. An eddy current test (ECT) embodiment of the invention comprises a means for deriving a reference signal from an ECT instrument excitation signal, a means for modulating the gain and phase of the reference signal by commands from a control computer, and a means for summing the modulated signal with the ECT probe output signal for transmission to the ECT instrument.