The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2004
Filed:
Aug. 07, 2002
Masatoshi Nishina, Wako, JP;
Honda Giken Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
Abnormality detection is conducted with respect to data indicative of operating state of an apparatus, the abnormality type is then discriminated and a check is made as to whether the data are already recorded in association with the discriminated abnormality type in a memory region corresponding to the data, and if not, the data are recorded in association with the discriminated abnormality type there. Since, multiple recording of similar data related to transient abnormalities and other such events that are likely to occur repeatedly can be prevented, important data related to a diversity of abnormalities and failures can be efficiently recorded in the memory. Viewed from another angle, this means that the capacity of the memory can be reduced and that a cost-reducing effect can be anticipated. In addition, data important for troubleshooting abnormalities and failures, most notably transition period data, can therefore be efficiently recorded in the memory.