The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2004

Filed:

Feb. 07, 2003
Applicant:
Inventors:

Ryu Shioda, Tokyo, JP;

Norihide Yamada, Kokubunji, JP;

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/035 ; H04B 1/008 ;
U.S. Cl.
CPC ...
G02F 1/035 ; H04B 1/008 ;
Abstract

The optical domain optical signal sampling device comprises an electrical sampling pulse source and an electrically-controlled optical modulator. The electrically-controlled optical modulator comprises electro-optical material, an optical waveguide located in the electro-optical material and including a bifurcated region, and electrodes disposed along the bifurcated region. The optical waveguide is arranged to receive an optical signal-under-test. At least one of the electrodes is connected to receive electrical sampling pulses from the electrical sampling pulse source. The electrical sampling pulses generate an electric field between the electrodes that differentially changes the refractive index of the electro-optical material in the bifurcated region of the optical waveguide to sample the optical signal-under-test.


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