The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2004
Filed:
May. 14, 2001
Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);
Michael Jarlath Brennan, Burnt Hills, NY (US);
Daniel Robert Olson, Voorheesville, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
This invention provides methodology for the measurement of both low and high levels of scattered radiation produced by decorative and barrier coatings and plastics. Measurements of low levels are especially important for coatings used in automotive applications. The method is based on the illumination of the sample with radiation and collection of only the portion of the radiation scattered from the coating before, during and after the testing step and relating the optical signal from the tested portion of the sample material to the untested portion of the material and/or a standard. Through the practice of the invention, a large number of coating samples, as in an array, may be analyzed for their optical quality, principally haze, either after coating and curing, and/or after subjection of such coatings samples to elongation stresses, and/or abrasion testing, solvent exposure, hydrolytic stability testing, and temperature exposure.