The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2004

Filed:

Dec. 06, 2002
Applicant:
Inventors:

Valentine N. Morozov, San Jose, CA (US);

Tokuyuki Honda, Sunnyvale, CA (US);

Long Yang, Union City, CA (US);

Assignee:

JDS Uniphase Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/608 ;
U.S. Cl.
CPC ...
G02B 2/608 ;
Abstract

Optical performance monitoring device for monitoring and analyzing an optical signal has a periodically movable reflective mirror to receive an input optical beam and to cyclically “scan” (deflect) the beam in a one-dimensional direction. The deflected beam at a varying deflection angle is directed to a linear variable filter (LVF) that passes a selected wavelength channel of the deflected beam in dependence upon the deflection angle. The selected channel is then passed to a photodetector via a focusing lens, typically a cylindrical lens. The device is durable, tunable, offers low loss, good wavelength registrability and spectral resolution.


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