The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2004

Filed:

Nov. 12, 2002
Applicant:
Inventor:

William P. Tanguay, Downers Grove, IL (US);

Assignee:

Maple Chase Company, Downers Grove, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 2/900 ;
U.S. Cl.
CPC ...
G08B 2/900 ;
Abstract

An adverse condition detect or that allows the user to test the apparatus in close proximity without having to endure full operational alarm activation. The adverse condition detector includes a detector, a transducer and a test system. When the detector senses an adverse condition, the transducer is activated to generate an alarm signal having an alarm level. When the test switch is activated, a test signal is generated at the alarm level and has a test duration that is substantially less than the duration of the alarm signal. In one embodiment of the invention, the alarm signal includes a plurality of alarm pulses having an alarm pulse duration and the test signal includes a plurality of test pulses each having a test pulse duration substantially less than the alarm pulse.


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