The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6836113 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 28, 2004

Filed:

Jan. 22, 2003
Applicant:
Inventor:

Weiguo Zhang, Foster City, CA (US);

Assignee:

Toshiba America MRI, Inc., Tustin, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A method is disclosed for determining a gradient-induced cross-term magnetic field in a magnetic resonance imaging (MRI) system involving the steps of: positioning an object in a static magnetic field; applying a radio frequency (RF) excitation pulse that spatially selects a slice of the object; applying an incremented phase-encoding magnetic gradient field along a phase encoding gradient field direction parallel to the slice phase; applying a selective RF refocusing pulse to select a line in the slice; applying a switched readout magnetic gradient; which causes a cross-term magnetic field, generating a data array of a phase-encoding gradient and a corresponding sample data point along the selected line, and determining a center frequency distribution (CF) for the selected line, where the CFR is indicative of a gradient-induced cross-term magnetic field.


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Zhang, Weiguo. (2004). Measurement and correction of gradient-induced cross-term magnetic fields in an epi sequence (U.S. Patent No. 6836113). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6836113

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