The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2004

Filed:

Nov. 20, 2002
Applicant:
Inventors:

Yaomin Lin, Hsinchu, TW;

Hau-Wei Wang, Taipei, TW;

Ying-Cheun Spring Yeh, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/135 ; G01N 2/164 ; G01N 2/165 ;
U.S. Cl.
CPC ...
G01N 2/135 ; G01N 2/164 ; G01N 2/165 ;
Abstract

A spectrum measuring apparatus for measuring infrared, Raman and fluorescence spectra. The spectrum measuring apparatus includes an infrared source, a laser source, an infrared up-conversion object lens, an object lens, a dual color lens, an ocular, a narrow band filter, a visible light image capturing device and a sample pedestal. The infrared spectrum is measured by the infrared up-conversion object lens. The Raman and fluorescence spectra are measured by the object lens.


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