The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2004
Filed:
Sep. 05, 2001
Applicant:
Inventors:
Fang Lei, Durchhausen, DE;
Jürgen Rudischhauser, Tuttlingen, DE;
Jörg Weitzel, Liptingen, DE;
Volker Preuss, Constance, DE;
Assignee:
Karl Storz GmbH & Co. KG, , DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 ; A61B 1/00 ;
U.S. Cl.
CPC ...
G01B 9/00 ; A61B 1/00 ;
Abstract
An apparatus for testing the state of the optical system of an endoscope comprises a first supporting device for the endoscope, a test pattern and a second supporting device for the test pattern, wherein the test pattern comprises a pattern, which allows a check of the actual viewing direction and of the actual field of view angle within tolerance values.