The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2004
Filed:
Sep. 13, 2002
Applicant:
Inventors:
Ray Fli Lee, Niskayuna, NY (US);
Christopher Judson Hardy, Schenectady, NY (US);
Assignee:
General Electric Company, Niskayuna, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract
A parallel Magnetic Resonance Imaging (MRI) system is provided for reconstructing images, to enable accelerated MRI with minimal artifacts. The MRI system comprises an array of magnetic resonance (MR) coils arranged in an array for detecting a plurality of MR signals, each coil having a corresponding spatial sensitivity profile and a processing means for processing the plurality of MR signals with at least one filter bank to reconstruct at least one image.
Lee, Ray. (2004). Method and apparatus for reconstruction of images in parallel mri systems (U.S. Patent No. 6833700). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6833700
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile