The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2004
Filed:
Mar. 17, 2003
Applicant:
Inventor:
Jan Axelsson, Uppsala, SE;
Assignee:
Amersham Biosciences AB, Uppsala, SE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 3/934 ;
U.S. Cl.
CPC ...
H01J 3/934 ;
Abstract
The present invention relates to analysis devices having means ( ) for producing a plurality of ion beams of samples substantially simultaneously; mass separating means for individually mass separating each ion beam in parallel and detecting means ( ) for detecting said mass separated ion beams substantially simultaneously, and to methods for using such devices.
Axelsson, Jan. (2004). Method and device for performing analyses in parallel (U.S. Patent No. 6833545). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6833545
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile