The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2004
Filed:
Apr. 01, 2002
Jennifer Campbell, Somerville, MA (US);
Bruce Collings, Bradford, CA;
Donald J. Douglas, Vancouver, CA;
University of British Columbia, Vancouver, CA;
Abstract
A method of and apparatus for analyzing a stream of ions first subjects astream of ions to a first mass analysis step, to select ions having a mass-to-charge ratio in a first desired range; this enables a mass analyzer with highresolution to be used. The selected ions are then passed into a radiofrequency linear ion trap containing a gas. The trapped ions are caused to collide with the gas, either by being injected with a high axial energy or by application of external excitation to cause fragmentation. Fragment ions of a given mass-to-charge ratio can then be isolated and excited to produce fragments of fragments. This process can be repeated to give multiple steps of mass spectrometry, MS . The fragment ions, and undissociated precursorions are then passed out of the linear ion trap and subjected to a further mass analysis step, for example in a time of flight device, to determine the mass spectrum of the ions.