The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2004
Filed:
Jun. 26, 2001
Applicant:
Inventors:
Scott Andrew Patten, Vancouver, CA;
Thomas W. Steiner, Burnaby, CA;
Michel Laberge, Bowen Island, CA;
Assignee:
Creo Inc., Burnaby, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41N 3/00 ;
U.S. Cl.
CPC ...
B41N 3/00 ;
Abstract
Methods and apparatus for determining the optimal adjustment of imaging systems used to prepare lithographic printing surfaces for a printing press are described. A series of test patterns are imaged while varying a particular imaging parameter. This is followed, if necessary, by processing the plate in processing line. The plate is then returned to the digital imaging system where the reflectivity of the imaged test patterns is measured using a radiation source and detector, to determine the optimal setting for the parameter.