The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2004

Filed:

Mar. 23, 2004
Applicant:
Inventors:

Alan Cherrette, Hermosa Beach, CA (US);

Erik Lier, Newtown, PA (US);

Bryan Cleaveland, Baldwinsville, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/26 ;
U.S. Cl.
CPC ...
H01Q 3/26 ;
Abstract

Methods and apparatus are provided for determining aperture phase distributions for use in radiating signals with an active phased array antenna having multiple beams and multiple carriers. Distinct initial phase distributions corresponding to the carriers are allocated. The initial phase distributions are modified for each of the carriers to generate respective radiation patterns that substantially correspond to respective coverage areas in accordance with amplification and radiation of signals having the initial phase distributions. The modified phase distributions are optimized to simultaneously increase carrier-signal power and reduce an intermodulation product radiated in the respective coverage areas in accordance with amplification and radiation of signals having the modified phase distributions.


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