The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2004
Filed:
Dec. 30, 2002
Ute Kollmer, Munich, DE;
Carsten Linnenbank, Munich, DE;
Ulrich Schaper, Munich, DE;
Roland Thewes, Grobenzell, DE;
Infineon Technologies AG, , DE;
Abstract
An apparatus and method for testing a plurality of electrical components that are coupled to one another. Further, an electrical selection unit, coupled to the electrical components to be tested, is provided for selecting at least one electrical component to be tested. A parasitic voltage drop in the testing circuit can be at least partially compensated using a control element coupled to the electrical components to be tested. The invention makes it possible, for testing of electrical components on a wafer over a large distance, i.e., several millimeters, to permit automated compensation of interference influences which occur as a result of the lines coupling or connecting the components to be tested.