The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2004
Filed:
Dec. 24, 2003
Shujirou Morinaga, Takahama, JP;
Kenichi Sago, Nishikamo-gun, JP;
Satoshi Kodou, Kariya, JP;
Kenichi Fujiki, Toyoake, JP;
Masayuki Kita, Kariya, JP;
Denso Corporation, Kariya, JP;
Abstract
A secondary air supply abnormality detection system determines that an abnormality is generated in a system including a secondary air supply system if a true secondary air flow rate is out of a predetermined range. The true secondary air flow rate is calculated by subtracting a secondary air flow rate average at the time when an air pump is not operating from another secondary air flow rate average at the time when the air pump is operating. Thus, variation in the secondary air flow rate due to change with time or production tolerance can be suitably corrected. Since calculation accuracy of the true secondary air flow rate is improved, determination accuracy of the abnormality in the system including the secondary air supply system can be improved.