The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2004

Filed:

Apr. 01, 2003
Applicant:
Inventors:

John B. Putman, Cuyahoga Falls, OH (US);

Matthew C. Putman, Cuyahoga Falls, OH (US);

Assignee:

Tech Pro, Inc., Cuyahoga Falls, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/110 ;
U.S. Cl.
CPC ...
G01N 1/110 ;
Abstract

A process for testing the properties of a rubber sample is provided. This process is suitable for use with current rheometers, curemeters, viscometers, and the like, wherein it is common to change test conditions during the duration of the test, when the rubber sample scorches or reaches full cure. This process provides a method for determining an optimal time for changing the test conditions to which the rubber sample is subjected. With this process specifying times for changing test conditions is no longer required prior to starting the test. Rather, the variable test condition is changed at sample-specific times that closely coincide with the actual scorch time or full cure time of the sample.


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