The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6829736 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 07, 2004

Filed:

May. 11, 2001
Applicant:
Inventors:

Erik Jan Marinissen, Eindhoven, NL;

Guillaume Elisabeth Andreas Lousberg, Eindhoven, NL;

Paul Wielage, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/300 ;
U.S. Cl.
CPC ...
H03M 1/300 ;
Abstract

A built-in self-diagnostic (BISD) memory device includes a two-dimension memory array provided with a redundant memory rows and columns that can be substituted for various ones in the two-dimension memory array by an external repair facility. A stimulus generator outputs multi-address test sequences to the memory array during a test mode. A response evaluator receives responses from the memory. A fault table stores evaluations of the responses, and communicates them to the external repair facility. A repair register indicates which memory columns have been intermediately scheduled for repair by the response evaluator. Column counters each accumulate the number of memory bit faults detected in a respective memory column. All are disposed in a single integrated circuit semiconductor device.


Find Patent Forward Citations

Marinissen, Erik. (2004). Method of testing a memory (U.S. Patent No. 6829736). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6829736

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