The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2004
Filed:
May. 07, 2001
Scott Richardson, Cedar Park, TX (US);
Jose Hernandez, Pflugerville, TX (US);
Patrick Christmas, Boulder, CO (US);
National Instruments Corporation, Austin, TX (US);
Abstract
An improved method and system for detecting differences between first and second test executive sequence files in a computer system. Each of the test executive sequence files may comprise a plurality of interrelated objects. The objects may be compared and differences between the objects may be displayed. The objects may comprise one or more of: a sequence; a global variable; and/or a data type. A sequence may comprise: a step, a parameter, and/or a local variable. A step of a sequence may comprise a tree structure of step properties. Each step property may comprise one or more of: a property value, property flags, and/or a property comment. An object may comprise a hierarchy of objects (e.g., a parent object and a child sub-object). Differences between the hierarchy of objects may be detected. Differences may be navigated. Each displayed difference may be characterized as an insertion or a deletion.