The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2004

Filed:

Dec. 07, 2000
Applicant:
Inventors:

Daniel R. Crouse, II, Hyde Park, NY (US);

Harrell Hoffman, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A method and system are described for efficiently overriding a value of a net in an array during execution of a test routine. The logic simulator machine is simulating a logic design which includes the array and multiple nets. A current value of the net is set equal to an override value. A normal update to the array is permitted to occur during execution of a single cycle of the test routine. A determination is then made regarding whether the override value is still stored in the array for the particular net. If the override value is not still stored in the array for this net, normal updates to the array are prohibited during a single cycle of the test routine. During this cycle of the test routine, the override value is then again stored in the net as the current value of the net. This override value is thus made available to be read during this cycle of the test routine while writes to the array are disabled. Normal updates are then again permitted to occur to the array in subsequent cycles of the test routine.


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