The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2004
Filed:
Mar. 10, 2003
Applicant:
Inventors:
Dennis B. Neff, Grove, OK (US);
Scott A. Runnestrand, Katy, TX (US);
Franklin D. Lane, Fulshear, TX (US);
Assignee:
ConocoPhillips Company, Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 ;
U.S. Cl.
CPC ...
G01V 1/28 ;
Abstract
A system for filtering elevation-sensitive data. The system generates coincident contour and attribute maps of a physical structure. A filter band that is limited to a certain range of contour values is used to filter the attribute values that are output to a CBA attribute map. The filter band applied to the data is defined between upper and lower boundaries, with each boundary having a substantially constant contour value. Thus, each data point has a uniquely-shaped a real filter that is at least partly defined by the filter band.