The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2004
Filed:
Nov. 18, 2002
Robert L. Popp, Hortonville, WI (US);
Kyle S. Allen, Neenah, WI (US);
Jamie L. Bell, Brillion, WI (US);
Henry L. Carbone, II, St. Paul, MN (US);
Scott G. Chapple, Neenah, WI (US);
Clinton David Clark, Reno, TX (US);
Tim G. Dollevoet, Kimberly, WI (US);
John G. Hein, Appleton, WI (US);
Archie Dodds Morgan, Neenah, WI (US);
Nicholas A. Popp, Appleton, WI (US);
Shawn A. Quereshi, Neenah, WI (US);
Erica C. Tremble, Appleton, WI (US);
Kimberly-Clark Worlwide, Inc., Neenah, WI (US);
Abstract
Combined information exchanges systems and methods suitable for use in connection with a manufacturing production line constructing a composite product. Some of the disclosed combined systems and methods include relating inspection data, such as product (or process) attribute data, to data from other manufacturing-related systems. Also disclosed are combined systems and methods for linking product (or process) attribute data obtained during the manufacturing process with one or more data sources including raw material data, process setting data, product quality data, and/or productivity data. Also disclosed are combined systems and methods for identifying manufacturing set point changes and automatically implementing such changes and automated web steering changes based on data from one or more inspection systems.