The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2004
Filed:
Mar. 24, 2000
Applicant:
Inventors:
Assignee:
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/68 ; G06K 9/36 ; G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/68 ; G06K 9/36 ; G06K 9/00 ;
Abstract
The image evaluation method and apparatus check for image abnormalities. In the method and apparatus, a Mahalanobis space is set preliminarily using a specified characteristic quantity extracted from specified image data. Then, Mahalanobis distance in the Mahalanobis space using image data read from an image to be evaluated. The calculated Mahalanobis distance is compared with a specified threshold value to check for the image abnormalities in the image to be evaluated. The method and apparatus provide a quantitative criterion in checking for abnormal image and enable image evaluation to be performed in a simple and rapid manner to realize efficient inspection.