The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2004
Filed:
Oct. 11, 2002
Issei Mori, Tochigi-ken, JP;
Akira Adachi, Otawara, JP;
Masahiro Kazama, Tochigi-ken, JP;
Satoshi Saito, Kuroiso, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
An X-ray CT scanner comprises an X-ray source generating an X-ray, detector detecting the X-ray transmitted through an object, processor to produce projection data, and reconstruction unit to reconstruct an image using the projection data. The processor produces the projection image by applying, to an output signal from the detector, logarithm conversion processing on a function deviating from an ideal logarithm function. The ideal logarithm function is a logarithm function defined by a mathematical formula of y=K·log [b, x] (wherein a variable x is an input, a variable y is an output, and a reference K shows a scaling constant). The function deviating from the ideal logarithm function has an input/output characteristic deviating from that of the ideal logarithm function. Such deviating function is for example a linear function and applied to a conversion of only low-count data into its projection data to suppress low-count artifacts on reconstructed CT images.