The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2004
Filed:
May. 13, 2003
Armin W. Doerry, Albuquerque, NM (US);
Peter A. Dudley, Albuquerque, NM (US);
Dale F. Dubert, Cedar Crest, NM (US);
Bertice L. Tise, Albuquerque, NM (US);
Sandia Corporation, Albuquerque, NM (US);
Abstract
Frequency dependent corrections are provided for quadrature imbalance and Local Oscillator (LO) feed-through. An operational procedure filters imbalance and LO feed-through effects without prior calibration or equalization. Waveform generation can be adjusted/corrected in a synthetic aperture radar system (SAR), where a rolling phase shift is applied to the SAR's QDWS signal where it is demodulated in a receiver; unwanted energies, such as LO feed-through and/or imbalance energy, are separated from a desired signal in Doppler; the separated energy is filtered from the receiver leaving the desired signal; and the separated energy in the receiver is measured to determine the degree of imbalance that is represented by it. Calibration methods can also be implemented into synthesis. The degree of LO feed-through and imbalance can be used to determine calibration values that can then be provided as compensation for frequency dependent errors in components, such as the QDWS and SSB mixer, affecting quadrature signal quality.