The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2004
Filed:
Sep. 20, 2002
Jesse J. Kolstad, Fife, WA (US);
Microscan Systems Inc., Renton, WA (US);
Abstract
The disclosure describes an apparatus and method for automatic gain control during scanning. The apparatus comprises an optical detector to receive an optical signal reflected from a symbol positioned within a scan window by an optical beam scanned from a leading edge of the scan window to a trailing edge of the scan window; and a processor coupled to the optical detector to adjust the gain of the optical detector during the beam scan. The process comprises receiving an optical signal using an optical detector, wherein the optical signal comprises optical energy reflected from a symbol positioned in a scan window as an optical beam scans from a leading edge of the scan window to a trailing edge of the scan window, and adjusting the gain of the optical detector during receipt of the optical signal. A calibration process is disclosed comprising calibrating the optical detector to obtain a plurality of gain corrections, each gain correction corresponding to a different position between a leading edge and a trailing edge of a scan window, and storing the plurality of gain corrections.