The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2004
Filed:
Oct. 04, 2002
Barry M. Mergenthaler, Lawrenceville, GA (US);
Paul Oliver Detwiler, Lawrenceville, GA (US);
John Kenneth Burkey, Duluth, GA (US);
Yeming Gu, Suwanee, GA (US);
NCR Corporation, Dayton, OH (US);
Abstract
Techniques for using imaging information computed from examining a scanner signal are described. When one or more objects passes within a field of view of a scanner, scan patterns emerging from one or more scanner windows and reflected from the objects back into the scanner windows produce one or more scanner signals. The scanner signals are processed to obtain beam position and beam length information to improve the accuracy of bar code decoding and to compute imaging information for objects within the field of view of the scanner. The imaging information for the objects is compared with bar code information for the objects. The expected number, size and shapes of objects indicated by the bar code information is compared with the actual number, size and shapes of objects in order to determine if valid scans occurred or if missed, double or otherwise erroneous scans occurred.