The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2004
Filed:
May. 12, 2000
Christopher T. Brown, Sunnyvale, CA (US);
Phares Grey, Milpitas, CA (US);
Oak Technology, Inc., Sunnyvale, CA (US);
Abstract
Method and system for optimally estimating the location of each of a sequence of two or more synchronization patterns in a digital signal bit stream. A first reference location for a sync pattern is determined. A Boolean product or other product of the sync pattern (of length S) with S consecutive bit values of the digital stream is formed, for each of a selected consecutive sequence of candidates for a second reference location of the sync pattern within a window of selected length. A candidate reference location that yields the largest (or smallest) product value within the window is estimated to be a second or “next” reference location of the sync pattern, if the product value is at least equal to (or, alternatively, is no greater than) a selected threshold value. The sync pattern used for testing the digital stream can be varied from one location to another. The number of bit matches or the number of bit non-matches can be used to determine an optimal reference location for the sync pattern.