The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2004
Filed:
Sep. 20, 2001
Applicant:
Inventors:
Kimio Tatsuno, Tokyo, JP;
Katsumi Kuroguchi, Yokohama, JP;
Hiroaki Furuichi, Yokohama, JP;
Atsuhiro Yamamoto, Yokohama, JP;
Norio Nakazato, Kashiwa, JP;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 3/13 ; H01S 3/04 ; H01S 3/00 ;
U.S. Cl.
CPC ...
H01S 3/13 ; H01S 3/04 ; H01S 3/00 ;
Abstract
Conventionally, in the wavelength locking optical system, the wavelength as detected is deviated from a targeted range owing to the change of the peripheral temperature resulting from the temperature characteristics of the wavelength error detection device. To solve this prior issue, it is arranged such that a portion of the wavelength error detection device, through which portion light-beams passes, contacts a material of high heat conductivity.