The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2004
Filed:
Oct. 30, 2001
Yoshiyuki Yanagimoto, Hyogo, JP;
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A measuring apparatus and a method is provided for measuring performance characteristics of a recording unit including a circular recording medium on which one track is divided into a plurality of sectors, where the recording unit records a data signal on the recording medium by using a magnetic head. A mechanism device including micro actuator and a piezo-electric stage moves the magnetic head in a direction substantially perpendicular to a circumferential direction of the recording medium in response to a control signal. The measuring apparatus writes a write signal for respective sectors while moving the magnetic head by outputting the control signal having different levels corresponding to respective sectors to the mechanism device, and reads out the written write signal, then measuring a read-out write signal as a read signal relative to a position of the magnetic head.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile