The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2004
Filed:
Mar. 28, 2003
Applicant:
Inventors:
Yasuhiro Watanabe, Saitama, JP;
Isamu Kaneko, Saitama, JP;
Assignee:
Enplas Corporation, Saitama, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 7/02 ; G02B 2/700 ; G02B 2/702 ; G01N 2/100 ; G01N 2/101 ;
U.S. Cl.
CPC ...
G02B 7/02 ; G02B 2/700 ; G02B 2/702 ; G01N 2/100 ; G01N 2/101 ;
Abstract
There is provided a sample inspection casing capable of easily and surely inspecting an object to be inspected. The sample inspection casing includes: a sample mounting table for mounting thereon an object to be inspected; a prism cut portion serving as an optical path changing portion for allowing the object on the sample mounting table to be irradiated with illuminating light; and an image magnifying lens for transmitting light, which is reflected on the object on the sample mounting table , to magnify an image of the object