The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2004
Filed:
Jun. 04, 2002
Paul J. Cronin, Charlestown, MA (US);
Daniel Orband, Lynn, MA (US);
Stephen D. Fantone, Lynnfield, MA (US);
Peter J. Miller, Newburyport, MA (US);
Cambridge Research and Instrumentation, Inc., Woburn, MA (US);
Abstract
The invention features a multi-spectral microscopy system for illuminating a sample with light of a selectable spectral content and generating an image of the sample in response to the illumination. The multi-spectral microscopy system includes a multispectral illuminator that provides output radiation having the selectable spectral content. A preferred set of optical arrangements for the multispectral illuminator generates the output radiation so that the spectral content of the output radiation is substantially uniform across its transverse profile. Furthermore, the multispectral illuminator can include monitoring optics and a corresponding detector array that independently monitors the output in each spectral band of the radiation produced by the multispectral illuminator. The monitoring provides calibration, feedback, and/or source aging information to insure robust and reliable performance for the multispectral illuminator. The multi-spectral microscopy system also includes a microscope which illuminates the sample with light derived from the output of the multispectral illuminator, and beam modification optics, which modify the output from the lamp prior to the microscope to increase the light efficiency of the microscope and fully exploit field of view and resolution of the microscope.