The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2004
Filed:
Sep. 26, 2003
Applicant:
Inventors:
Kyle S. Johnston, Sammamish, WA (US);
Joseph A. Franklin, Vancouver, WA (US);
Spencer G. Nelson, Bothell, WA (US);
Charles M. Bass, Kirkland, WA (US);
Assignee:
Metron Systems, Inc., Snoqualmie, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/126 ; G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/126 ; G01B 1/124 ;
Abstract
A system for measuring the external surface profile of a component using a non-contact optical technique which scans the field of view with a spot of light through a range of angles by utilizing a rotating mirror system and which precisely determines the angular position of the spot of light during scanning.