The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2004
Filed:
Oct. 05, 2001
Applicant:
Inventors:
Assignee:
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract
An eye's optical characteristic measuring system comprises an aperture diaphragm arranged at a position approximately conjugate to a pupil of an eye under testing and for determining regions to pass a light beam on the pupil , a projection optical system for projecting a primary index image on a fundus of the eye under testing via the aperture diaphragm, a photodetection optical system for forming a secondary index image on a photoelectric detector via the aperture diaphragm by a reflected light beam from the fundus of the eye under testing, and detecting units and for detecting a light amount intensity distribution of the secondary index image based on a signal from the photoelectric detector.