The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2004

Filed:

May. 07, 2003
Applicant:
Inventors:

Dingding Chen, Plano, TX (US);

Roger L. Schultz, Aubrey, TX (US);

Craig Zitterich, Corinth, TX (US);

Martin T. Hagan, Stillwater, OK (US);

Meng Fun, Tulsa, OK (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 2/700 ;
U.S. Cl.
CPC ...
G01L 2/700 ;
Abstract

A system and method for dynamically calibrating signals from a quartz pressure sensor to correct for temperature transients. A series of differences of time spaced temperature readings is stored in a tapped delay line and coupled to a transfer function. The transfer function uses the temperature difference values to correct pressure frequency readings for temperature transient errors. In one form, one transfer function uses temperature and pressure readings to statically calibrate pressure readings and a second transfer function uses temperature differences to provide a temperature transient correction which is added to the statically calibrated pressure value.


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