The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2004

Filed:

Dec. 31, 2002
Applicant:
Inventors:

Matthew Scott Wingren, Rochester, MN (US);

George Wayne Nation, Eyota, MN (US);

Gary Scott Delp, Rochester, MN (US);

Jonathan William Byrn, Kasson, MN (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A tool for designing an integrated circuit and semiconductor product that generates correct RTL for I/O buffer structures in consideration of the requirements of diffused configurable I/O blocks and/or I/O hardmacs of the product. Given either a slice description of a partially manufactured semiconductor product, a designer can generate the I/O resources of an application set. Then given an application set having a transistor fabric, and the diffused configurable I/O blocks and/or the I/O hardmacs, and a plurality of accompanying shells, the I/O generation tool herein automatically reads a database having the slice description and generates the I/O buffer structures from the transistor fabric. The I/O generation tool further conditions and integrates input from either or both customer having her/his own logic and requesting a specific semiconductor product or from IP cores with their preestablished logic. The I/O generation tool creates correct RTL from the transistor fabric for correct placement, timing, testing, and function of I/O buffer amplifiers for the semiconductor product, either incrementally or globally. Once I/O buffer structures are created, they are qualified by a plurality of shells including a verification shell, a static timing analysis shell, a manufacturing test shell, and a RTL analysis shell.


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