The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2004

Filed:

May. 02, 2001
Applicant:
Inventors:

Mark A. Kampe, Los Angeles, CA (US);

Frederic Herrmann, Palo Alto, CA (US);

Stephane Brossier, San Francisco, CA (US);

Assignee:

Sun Microsystems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

The present invention describes a method and system for providing cluster replicated checkpoint services. In particular, the method provides cluster replicated checkpoint services for replicas of a checkpoint in a cluster. The cluster includes a first node and a second node, which are connected to one another via a network. The replicas include a primary replica and a secondary replica. The method includes managing the checkpoint that contains checkpoint information, and creating the primary replica in a memory of the first node. The primary replica contains first checkpoint information. The method also includes updating the primary replica so that the first checkpoint information corresponds to the checkpoint information, creating the secondary replica that contains second checkpoint information in a memory of the second node, and updating the secondary replica so that the second checkpoint information corresponds to the checkpoint information.


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