The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2004

Filed:

Jan. 25, 2002
Applicant:
Inventors:

Tsuneo Sakamoto, Burlington, CA;

Nobuyuki Ishizaki, Brantford, CA;

Assignee:

Miura Co., Ltd., Matsuyama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ; G06F 1/546 ; G01B 7/00 ;
U.S. Cl.
CPC ...
G06F 1/100 ; G06F 1/546 ; G01B 7/00 ;
Abstract

A system for inspecting thermal equipment includes a communication line for connecting a facility site and a management center to each other. At the facility site, an operating state information collecting device collects information related to operating states of the thermal equipment. An information processing device fetches the information via the communication line and executes creation of report data for recording related to inspection data of the thermal equipment and delivers the created report data to the facility site. A center-side modem is interposed between the information processing device and the communication line. An output device provided at the facility site outputs a report based on the delivered report data. The report data is stored in a data storage device at each time of creation of the report data. Thus, the system inspecting thermal equipment allows for a reduction in labor.


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