The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6823286 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 23, 2004

Filed:

Jun. 26, 2003
Applicant:
Inventors:

Rafael Yuste, New York, NY (US);

Vikram S. Kumar, Boston, MA (US);

Robert C. Froemke, Oakland, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

Disclosed is a method for analyzing a sequence of data arrays. A selection of at least one type of region of interest and at least one region of interest from said data arrays is made. The sequence of data arrays are then transformed into a simplified data array. Events of interest in the selected regions of interest are then detected and stored in a second simplified data array. The data is then analyzed to determine relationships between the detected events of interest


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