The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2004
Filed:
Apr. 04, 2003
David V. Blackham, Santa Rosa, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A system and method are disclosed which provide for flexible and accurate test apparatus error value calculation. Error value calculation of a testing apparatus requires at least one unique measurement for each unknown error value using the equation that relates the measured response, the predicted response and the error value. When more equations than unknowns can be acquired, the system of equations is over-determined and an improvement of accuracy is possible, but accuracy may be lost when the predicted responses are not trusted to the same degree. The disclosed system and method provide the increased accuracy of an over-determined system, while accounting for predicted responses of varying degrees of trust.