The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2004

Filed:

Sep. 13, 2002
Applicant:
Inventors:

Ying-Tsung Lu, Hsinchu Hsien, TW;

Ching-Chin Wu, Taichung Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/34 ; G02B 2/744 ; G03H 1/04 ;
U.S. Cl.
CPC ...
G02B 6/34 ; G02B 2/744 ; G03H 1/04 ;
Abstract

A grating interference device with adjustable resolution has high stability and precision adjustment functions. The invention has two reflectors and a beam splitter. One of the reflector is installed on a rotating axis along with an optic fiber or a platform of planar waveguide. Through the rotating axis, this reflector and the platform are maintained at a fixed relative angle and rotate with respect to the other reflector and the beam splitter. The period of the interference grating is controlled by the angle change, producing a grating with a micrometer-order period on the optic fiber or the planar waveguide.


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