The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2004
Filed:
Sep. 28, 2000
Eastman Kodak Company, Rochester, NY (US);
Abstract
A digital image processing determining the extent of blocking and contouring artifacts in a digital image includes the steps of: determining the extent of blocking artifacts using the column and row difference arrays; determining the extent of contouring artifacts based on an estimated DC quantization step size; and, determining a composite artifact measure as a function of the extent of blocking artifacts and extent of contouring artifacts. A digital image processing method determining the extent of contouring artifacts in the digital image includes the steps of: forming a column difference image; averaging the values in the columns in the column difference image to produce a column difference array; computing the average of the values in the column difference array that are separated by one block width to produce a block averaged column difference array; locating the peak value in the block averaged column difference array; repeating the above mentioned steps in the row direction; locating block boundaries based on the locations of peak values of column and row difference arrays; calculating DC value for each block; generating a histogram of the block DC values; calculating the Fourier transform of the histogram; locating the first non-DC peak in the Fourier transform domain; calculating a DC quantization step size based on the frequency of the first non-DC peak; and, employing the DC quantization step size as a measure of the extent of the contouring artifacts in the digital image.