The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2004
Filed:
Dec. 11, 2001
Joel Jung, Guyancourt, FR;
Jorge E. Caviedes, Yorktown Heights, NY (US);
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The present invention relates to a method of measuring video quality. Said method comprises a step of determining ( ) at least one reference level (JND) above which visual artifacts become noticeable to a group of subjects, with a corresponding predetermined artifact metric (M), from a set of reference sequences (RS) of digital pictures only comprising a corresponding artifact. The method of measuring video quality also comprises a step of measuring ( ) at least one artifact level (L) of the input sequence (IS) with the corresponding predetermined artifact metric (M). It further comprises a step of computing ( ) a video quality metric (OQM) of the input sequence from at least one ratio of the artifact level (L) to the reference level (JND) corresponding to a same predetermined artifact metric. Such a method of measuring video quality provides an objective quality metric.